Pivot points
Before we begin to scan the probe to make a STEM image, it
is essential to check the pivot points. (Sadly, this is not possible
on all makes of machine because it is regarded as 'too difficult' by
the manufacturers. However, you can usually obtain access to the
control indirectly via the computer.) Think of the
following diagram, where the pivot points are incorrectly
adjusted:
In an ideal world, the probe continues to point in exactly
the same direction as it is scanned over the specimen by the
beam shift coils. However, if the rocking
point of the scan coils is wrong, the beam tilts as well as
shifts (see introductory guide if you have forgotten the meaning of
tilt and shift). This has two consequences: the Ronchigram
moves relative to the detectors as the probe is scanned, and
the magnification of the STEM image will be uncalibrated.
At worst, the beam may be only tilting, and not moving
laterally at all, in which case the apparent magnification
of the STEM image will be much higher than the nominal
value. Note that this pivot point adjustment is quite
different to the pivot point values in TEM mode. In the
latter, we adjust for a stationary probe as a function of
tilt; here we adjust for stationary tilt as a function of
shift. We are aiming for shift purity.
There are different ways of making this adjustment on
different machines. It is essential to correct it for each
spot size and/or objective/condenser combinations of
setting. The way the beam shift interacts with the
objective pre-field means that the degree of tilt can be
strongly correlated to strength of the objective.
Ask the demonstrator: How do I adjust the pivot points in STEM
mode?
If in doubt, one way of doing this is to assume the
objective aperture is truly in the back focal plane of the
objective lens (usually, it is not quite in the back focal plane). If
we pretend it is in the back focal plane, then a
way of testing the pivot points is to select diffraction
mode and observe the Ronchigram. Insert a small objective
aperture (smaller than the Ronchigram), which should cast a shadow over the Ronchigram,
and switch on the pivot point adjustment.
If two objective
apertures become visible, the diffraction lens is not
focussing on the back focal plane; focus the diffraction
lens until only one objective aperture is visible. Now
remove the objective aperture and adjust the STEM pivot points
until the two Ronchigrams are superposed. Note that in STEM
mode, focussing the diffraction lens in diffraction mode
does not mean making the beam make a sharp point (as in TEM
diffraction), because there a very large range of angles
present in the conical beam coming out of the specimen
Copyright J M Rodenburg
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